Latest Papers

Effect of sliding speed and counterface properties on the tribo-oxidation of brush seal material under dry sliding conditions
MR Thakare, JF Mason, AK Owen, DRH Gillespie, AJ Wilkinson, G Franceschini
Tribology International (2013) available online 18 February 2013
doi:10.1016/j.triboint.2013.02.010


Controlling the Orientation, Edge Geometry and Thickness of Chemical Vapor Depostion Graphene
AT Murdock, A Koos, TB Britton, L Houben, T Batten, T Zhang, AJ Wilkinson, RE Dunin-Borkowski, CE Lekka, N Grobert
ACS Nano, (2013), vol. 7 ,1351–1359
doi:10.1021/nn3049297


Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size
J Jiang, TB Britton and AJ Wilkinson
Ultramicroscopy, (2013), vol. 125, 1-9
doi:10.1016/j.ultramic.2012.11.003


Planes Strains and EBSD in Materials Science
AJ Wilkinson and TB Britton
Materials Today, (2012), vol. 15, 366–376
doi:10.1016/S1369-7021(12)70163-3


Stress fields and geometrically necessary dislocation density distributions near the head of a blocked slip band
TB Britton and AJ Wilkinson
Acta Materialia, (2012), vol. 60, 5773–5782
doi:10.1016/j.actamat.2012.07.004


News

New Grant
EPSRC have recently anounced funding for a large programme grant on Heterogeneous mechanics in hexagonal alloys across length and time scales. The OxfordMicromechanics group is part of a collaborative team lead by Prof Fionn Dunne at Imperial College and involving groups at Manchester. The whole team is excited by this award and keen to push forward with understanding, improving, and further exploiting the hexgonal Ti and Zr alloys.


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Poster Prize
Ben Britton received the best poster prize at the recent RMS EBSD 2012 Conference at the NPL. It details EBSD mapping of stress and GND density near a slip band-grain boundary interaction in Ti.


EBSD_ECCI_CL


New Grant
The OxfordMicromechanics group is collaborating with Dr Trager-Cowan's group at Strathclyde, on nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC. Information generated will be used to help our collaborating film growers at Strathclyde, Imperial, Nottingham, Bath and Cambridge to improve the quality of materials they produce.
Meet us at

EMAS 2013 -European Microbeam Analysis Society
Porto, Portugal, 12-16 May 2013
- Angus W on 'A review of advances and challenges in EBSD strain mapping'


Microscopy and Microanalysis 2013
Indianapolis, IN 4-8 August 2013
- Angus W on 'Strain Mapping with Electron Back Scatter Diffraction: Sensitivity Studies and Pattern Remapping'


Materials Science and Technology 2013
Montreal, Canada, 27-31 October 2013
- presentations by Yi, Jun and Angus on 'Deformation at Grain Boundaries'