Ultramicroscopy Most Cited


Ultramicroscopy Most Cited



Contact: Angus Wilkinson


High Resolution Elastic Strain Measurement from Electron Backscatter Diffraction Patterns :-  New Levels of Sensitivity
Wilkinson A. J., Meaden G. and Dingley D. J.
Ultramicroscopy (2006), vol. 106, 307-313
doi:10.1016/j.ultramic.2005.10.001