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Contact: Angus Wilkinson High Resolution Elastic Strain Measurement from Electron Backscatter Diffraction Patterns :- New Levels of Sensitivity Wilkinson A. J., Meaden G. and Dingley D. J. Ultramicroscopy (2006), vol. 106, 307-313 doi:10.1016/j.ultramic.2005.10.001 |
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