Contact: Angus Wilkinson
High resolution mapping of strains and rotations using electron backscatter diffraction, Wilkinson A. J., Meaden G. and Dingley D. J., Materials Science and Technology (2006) vol.22, 1271-1278, doi:10.1179/174328406X130966
See also: doi:10.1016/j.ultramic.2005.10.001, doi:10.1016/1359-6454(95)00147-9, & BLG Productions Ltd


