rotation about surface normal |
rotation about vertical axis |
rotation about horizontal axis |
Electron back scatter diffraction was used to map strain and rotation fields near a 500 nm deep Berkovic indent in Fe. Patterns were acquired at full 1kx1k resolution of camera and cross correlation analysis using CrossCourt2 software used to obtain strains and rotations. The rotations, shown here, were generally larger than the elastic strains and provide a means of assessing the plastic flow and geometrically necessary dislocation distribution that builds up around the indent. |
Contact: Angus
Wilkinson
High resolution mapping of strains and rotations using electron backscatter
diffraction. , Wilkinson A. J., Meaden G. and Dingley D. J.,
Materials Science and Technology (2006) vol.22, 1271-1278, doi:10.1179/174328406X130966
See also: doi:10.1016/j.ultramic.2005.10.001, doi:10.1016/1359-6454(95)00147-9, & BLG Productions Ltd