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Journal Papers
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2012
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High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations
TB Britton and AJ Wilkinson
Ultramicrscopy, (2012), available on line from 18 January 2012
doi:10.1016/j.ultramic.2012.01.004
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2011
|
Mechanical properties of ion-implanted tungsten–5wt% tantalum
DEJ Armstrong, AJ Wilkinson and SG Roberts
Physica Scripta, (2011), vol. T145, 014076
doi:10.1088/0031-8949/2011/T145/014076
Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
AJ Wilkinson
Journal of Physics: Conference Series, (2011), vol. 59, 6489-6500
doi:10.1088/1742-6596/326/1/012004
Geometrically necessary dislocation density distributions in Ti–6Al–4V deformed in tension
PD Littlewood, TB Britton, AJ Wilkinson
Acta Materialia, (2011), vol. 59, 6489-6500
doi:10.1016/j.actamat.2011.07.016
A microcantilever investigation of size effect, solid-solution strengthening and second-phase strengthening for <a> prism slip in alpha-Ti
J Gong and, AJ Wilkinson
Acta Materialia, (2011), vol. 59, 5970-5981
doi:10.1016/j.actamat.2011.06.005
Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction
TB Britton and AJ Wilkinson
Ultramicroscopy, (2011) vol. 111, 1395-1404
doi:10.1016/j.ultramic.2011.05.007
Micro-mechanical measurements of fracture toughness of bismuth embrittled copper grain boundaries
DEJ Armstrong, AJ Wilkinson, SG Roberts
Philosophical Magazine Letters, (2011), vol. 91, 394-400
doi: 10.1080/09500839.2011.573813
Micro-cantilever testing of a prismatic slip in commercially pure Ti
JC Gong, AJ Wilkinson
Philosophical Magazine, (2011), vol. 91, 1137 - 1149
doi:10.1080/14786435.2010.495359
High resolution electron back-scatter diffraction analysis of thermally and mechanically induced strains near carbide inclusions in a superalloy
PS Karamched and, AJ Wilkinson
Acta Materialia, (2011), vol. 59, 263-272
doi:10.1016/j.actamat.2010.09.030
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2010
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Factors affecting the accuracy of High resolution electron backscatter diffraction when using simulated patterns
TB Britton, C Maurice, R Fortunier, JH Driver, AP Day, G Meaden, DJ Dingley, K Mingard and, AJ Wilkinson
Ultramicroscopy, (2010), vol. 110, 1443-1453
doi:10.1016/j.ultramic.2010.08.001
Elastic strain tensor measurement using electron backscatter
diffraction in the SEM
DJ Dingley, AJ Wilkinson, G Meaden, PS Karamched
Journal of Electron Microscopy, (2010), vol. 59, S155-S163
doi:10.1093/jmicro/dfq043
High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
AJ Wilkinson, EE Clarke, TB Britton, P Littlewood, PS Karamched
Journal of Strain Analysis for Engineering Design, (2010), vol. 45, 365-376
doi:10.1243/03093247JSA587
Investigation of elastic properties of single-crystal α-Ti
using microcantilever beams
J Gong and AJ Wilkinson
Philosophical Magazine Letters, (2010), vol. 90, 503-512
doi:10.1080/09500831003772989
Determination of elastic strain fields and geometrically necessary dislocation
distributions near nanoindents using electron back scatter diffraction
AJ Wilkinson and D Randman
Philosophical Magazine, (2010), vol. 90, 1159-1177
doi:10.1080/14786430903304145
Dislocation modeling of quasi-static crack propagation in an elasto-plastic medium
A Stoll and AJ Wilkinson
Int. J. Fracture, (2010), vol. 164, 103-115
doi:10.1007/s10704-010-9459-8
Electron backscatter diffraction study of dislocation content of a macrozone in hot-rolled Ti–6Al–4V alloy
TB Britton, S Birosca, M Preuss and AJ Wilkinson
Scripta Materialia, (2010), vol. 62, 639-642
doi:10.1016/j.scriptamat.2010.01.010
The effect of crystal orientation on the indentation response of commercially pure titanium:
experiments and simulations
TB Britton, H Liang, FPE Dunne and AJ Wilkinson
Proceedings of the Royal Society A, (2010), vol. 466, 695-719
doi: 10.1098/rspa.2009.0455
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2009
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Characterisation of plastic zones around crack-tips in pure single-crystal tungsten using electron backscatter diffraction
JD Murphy, AJ Wilkinson and SG Roberts
IOP Conf. Series: Materials Science and Engineering, (2009), vol. 3, 012015
doi:10.1088/1757-899X/3/1/012015
Measuring anisotropy in Young’s modulus of copper using microcantilever testing
DEJ Armstrong, AJ Wilkinson and SG Roberts
J. Materials Research, (2009), vol. 24, 3268-3276
doi:10.1557/JMR.2009.0396
Anisotropy in the Plastic Flow Properties of Single Crystal Alpha Titanium Determined from Micro Cantilever Beams
J Gong and AJ Wilkinson
Acta Materialia, (2009), vol. 57, 5693-5705
doi:10.1016/j.actamat.2009.07.064
Mapping strains at the nanoscale using electron back scatter diffraction
AJ Wilkinson, G Meaden, DJ Dingley
Superlattices and Microstructures, (2009), vol. 45, 285-294
doi:10.1016/j.spmi.2008.10.046
A nanoindentation study of slip transfer phenomenon at grain boundaries
TB Britton, D Randman, and AJ Wilkinson
J. Materials Research, (2009), vol. 24, 607-614
doi:10.1557/JMR.2009.0088
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2008
|
Ductile-brittle transition of poly-crystalline iron and iron-chromium alloys
M Tanaka, AJ Wilkinson, SG Roberts
J. Nuclear Materials, (2008) vol. 378,
305-311
doi:10.1016/j.jnucmat.2008.06.039
Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride
Thin Films
C Trager-Cowan, F Sweeney, PR Edwards, FL Dynowski, AJ Wilkinson,
A Winkelmann, AP Day, T Wang, PJ Parbrook, IM Watson, and DC Joy
Microscopy
& Microanalysis, (2008), vol. 14 (Suppl 2), 1194-1195
doi:10.1017/S1431927608086856
|
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2007
|
Brittle-ductile transitions in vanadium and iron-chromium
TD Joseph, M Tanaka, A. J. Wilkinson, and SG Roberts
J. Nuclear Materials,
(2007), vol. 367-370, 637-643
doi:
10.1016/j.jnucmat.2007.03.077
Electron backscatter diffraction and electron channeling contrast imaging of tilt
and dislocations in nitride thin films
C. Trager-Cowan and F. Sweeney, P. W. Trimby, A. P. Day, A. Gholinia, and N.-H.
Schmidt, P. J. Parbrook, A. J. Wilkinson, and I. M. Watson
Physical Review B,
(2007), vol. 75, 085301
doi:
10.1103/PhysRevB.75.085301
Low-temperature fracture mechanisms in a spheroidised reactor pressure vessel
steel
A. Kumar, S. G. Roberts and A. J. Wilkinson,
Int J Fracture, (2007), vol.
144,121-129
doi:
10.1007/s10704-007-9084-3
Quasi-cleavage fracture planes in spheroidized A533B steel
A. Kumar, A. J. Wilkinson, and S. G. Roberts,
J Microscopy, (2007), vol.
227, 248-253
doi:
10.1111/j.1365-2818.2007.01808.x
Experimental and Computational Studies of Low Cycle Fatigue Crack Initiation in a
Polycrystal
FPE Dunne, AJ Wilkinson, R Allen
Int J Plasticity,
(2007), vol. 23, 273-295
doi:10.1016/j.ijplas.2006.07.001
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2006
|
High resolution measurements of strain and tilt distributions in SiGe mesas using
electron backscatter diffraction
Wilkinson AJ
Applied Physics Letters, (2006), vol. 89, 241910
doi:10.1063/1.2403904
Quantification of plastic strain of stainless steel and nickel alloy by electron
backscatter diffraction
Kamaya M, Wilkinson AJ, Titchmarsh JM
Acta
Materialia (2006), vol. 54, 239-248
doi:10.1016/j.actamat.2005.08.046
High Resolution Elastic Strain Measurement from Electron Backscatter Diffraction
Patterns :- New Levels of Sensitivity
Wilkinson A. J., Meaden G. and
Dingley D. J.
Ultramicroscopy (2006), vol. 106, 307-313
doi:10.1016/j.ultramic.2005.10.001
Characterising Dislocation Structure Evolution during Cyclic Deformation using
Electron Channelling Contrast Imaging
Ahmed J, Wilkinson A J and Roberts S
G
invited paper for Special Issue of Philosophical Magazine celebrating “50
years of TEM of Dislocations”
Philosophical Magazine (2006), vol 86, 4965-4981
doi:10.1080/14786430600710941
High resolution mapping of strains and rotations using electron backscatter
diffraction
Wilkinson A. J., Meaden G. and Dingley D. J.
Materials
Science and Technology (2006) vol.22, 1271-1278
doi:10.1179/174328406X130966
Characterisation of nitride thin films by electron backscatter diffraction and
electron channelling contrast imaging
C. Trager-Cowan, F. Sweeney, A.
Winkelmann, A. J. Wilkinson, P. W. Trimby, A. P. Day, A. Gholinia, N. H. Schmidt, P.
J. Parbrook and I. M. Watson
Materials Science and Technology (2006) vol.22,
1352-1358
doi:10.1179/174328406X130957
|
|
2005
|
Measurement of plastic strain of polycrystalline material by electron backscatter
diffraction
Kamaya M, Wilkinson AJ, Titchmarsh JM
Nuclear Engineering
& Design (2005), vol. 235 , 713-725
doi:10.1016/j.nucengdes.2004.11.006
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2004
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2003
|
|
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2002
|
Modelling the initiation of cleavage fracture of ferritic steels
Roberts SG, Noronha SJ, Wilkinson AJ and Hirsch PB
Acta Materialia (2002), vol.
50, 1229-1244
doi:10.1016/S1359-6454(01)00425-6
High temperature fatigue crack growth in powder processed nickel based superalloy
U720Li
Tucker AM, Henderson MB, Wilkinson AJ, Hide NJ, and Reed PAS
Materials Science and Technology (2002), vol. 18, 349-353
doi:10.1179/026708302225001840
Orientation dependence of the high cycle fatigue properties in a hot-cross rolled
Al-Li 8090 alloy plate
Zhai T, Wilkinson AJ, and Martin JW
Materials
Science Forum (2002), vol. 396-402, 1279-1284
|
|
2001
|
Electron channelling contrast imaging characterization of dislocation structures
associated with extrusion and intrusion systems and fatigue cracks in copper single
crystals
Ahmed J, Wilkinson A J and Roberts S G
Philosophical
Magazine (2001), vol 81, 1473-1488
doi:10.1080/01418610010001303
A new method for determining small misorientations from electron back scatter
diffraction patterns
Wilkinson AJ
Scripta Materialia (2001), vol. 44,
2379-2385
doi:10.1016/S1359-6462(01)00943-5
Modelling the effects of texture on the statistics of stage I fatigue crack
growth
Wilkinson AJ
Philosophical Magazine (2001), vol 81, 841-855
doi:10.1080/01418610151133276
Grain boundary misorientation and thermal grooving in cube-textured Ni and Ni-Cr
tape
Gladstone TA, Moore JC, Wilkinson AJ and Grovenor CRM
IEEE
Transactions on Applied Superconductivity (2001), vol. 11, 2923-2926
doi:10.1080/01418610151133276
|
|
2000
|
A crystallographic mechanism for fatigue crack propagation through grain
boundaries
Zhai T,Wilkinson AJ and Martin JW
Acta Materialia (2000), vol.48,
4917-4927
doi:10.1016/S1359-6454(00)00214-7
Measurement of fatigue crack plastic zones in fine-grained materials using
electron backscatter diffraction
Tucker AM, Wilkinson AJ, Henderson MB and
Martin JW
Material Science and Technology (2000), vol.16, 457-462
link to article on Ingenta Connect
Control of texture in Ag and Ag-alloy substrates for superconducting tapes
Gladstone TA, Moore JC, Henry BM, Speller S, Salter CJ, Wilkinson AJ and Grovenor
CRM
Superconductor Science and Technology (2000), vol. 13, 1399-1407
doi:10.1088/0953-2048/13/9/319
Effects of micro-texture and β′ particle distribution on short fatigue crack
growth in an Al-Li 8090 alloy
Zhai, T., Wilkinson, A.J., Martin, J.W.
Materials Science Forum (2000), vol. 331-3, 1549-1554
Advances in SEM based diffraction studies of defects and strains in
semiconductors
Wilkinson AJ
Journal of Electron Microscopy (2000),
vol.49, 299-310
link to paper in oxfordjournals.org
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1999
|
Sample geometry effect in four point bend fatigue
Zhai T, Xu YG, Martin
JW, Wilkinson AJ and Briggs GAD
International Journal of Fatigue (1999), vol. 21,
889-894
doi:10.1016/S0142-1123(99)00084-5
Influence of grain orientations on the initiation of fatigue damage in an Al-Li
alloy
Taylor CJ, Zhai T, Wilkinson AJ and Martin JW
Journal of
Microscopy (1999), vol. 195, 239-247
doi:10.1046/j.1365-2818.1999.00573.x
Study of dislocation structures near fatigue cracks using electron channelling
contrast imaging technique (ECCI)
Ahmed J, Wilkinson AJ and Roberts SG
Journal of Microscopy (1999), vol. 195, 197-203
doi:10.1046/j.1365-2818.1999.00574.x
Decoherence in electron backscattering by kinked dislocations
Dudarev S. L., Ahmed J., Hirsch P. B., and Wilkinson A. J.
Acta
Crystallographica (1999), vol. A55, 234-245
doi:10.1107/S0108767398014810
Fabrication of biaxially textured Ni substrates and LaNiO3 buffer layers for
Tl-1223 thick films
Gladstone TA, Moore JC, Wilkinson AJ, and Grovenor CRM
IEEE Trans. on
Applied Superconductivity (1999), vol. 9, 2252-2255
link to paper at ieee.org
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1998
|
Microstructural studies of Tl2Ba2Ca2Cu3Ox thin films on LaAlO3 and MgO
substrates
Bramley AP, Wilkinson AJ, Jenkins AP and Grovenor CRM
Journal of Superconductivity (1998), vol. 11, 71-72
doi:10.1023/A:1022685913672
On the secondary recrystallisation of MA754
Miodownik MA, Wilkinson AJ
and Martin JW
Acta Materialia (1998), vol. 46, 2809-2821
doi:10.1016/S1359-6454(97)00460-6
Detection of small lattice strains using beam rocking on a nuclear
microprobe
deKerckhove DG, Breese MBH, Wilkinson AJ, and Grime GW
Nuclear Instruments & Methods in Physics Research Section B- Beam Interactions
with Materials and Atoms (1998), vol. 138, 1240-1243
doi:10.1016/S0168-583X(98)80020-7
Modelling the threshold conditions for the propagation of a stage I fatigue
crack
Wilkinson AJ, Roberts SG and Hirsch PB
Acta Materialia (1998),
vol. 46, 379-390
doi:10.1016/S1359-6454(97)00290-5
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1997
|
Characterising dislocation structures in bulk fatigued copper single crystals
using electron channelling contrast imaging (ECCI)
Ahmed J, Wilkinson AJ
and Roberts SG
Philosophical Magazine Letters (1997), vol. 76, 237-245
doi:10.1080/095008397178986
Methods for determining elastic strains from electron back scatter diffraction and
electron channelling patterns
Wilkinson AJ
Materials Science and
Technology (1997), vol. 13, 79-84
[no online version available]
Electron diffraction based techniques in scanning electron microscopy of bulk
materials
Wilkinson AJ and Hirsch PB
MICRON (1997), vol. 28, 279-308
(invited review paper)
doi:10.1016/S0968-4328(97)00032-2
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1996
|
A dislocation model for the two critical stress intensities required for
threshold fatigue crack propagation
Wilkinson AJ, Roberts SG
Scripta Materialia (1996), vol. 35, 1365-1371
doi:10.1016/1359-6462(96)00301-6
Fatigue damage at room temperature in aluminium single crystals - III. Lattice
rotation
Zhai T, Martin JW, Briggs GAD, Wilkinson AJ
Acta Materialia (1996), vol. 44,
3477-3488
doi:10.1016/1359-6454(96)00026-2
Examination of fatigue crack plastic zones using
scanning-electron-microscope-based electron diffraction techniques
Wilkinson AJ, Henderson MB, and Martin JW
Philosophical Magazine Letters
(1996), vol. 74, 145-151
doi:10.1080/095008396180290
Observation of strain distributions in partially relaxed In0·2Ga0·8As on GaAs
using electron channelling contrast imaging
Wilkinson AJ
Philosophical Magazine Letters (1996), vol. 73, 337-344
doi:10.1080/095008396180605
Measurement of elastic strains and small lattice rotations using electron back
scatter diffraction
Wilkinson AJ
Ultramicroscopy (1996), vol. 62, 237-247
doi:10.1016/0304-3991(95)00152-2
Faceted voids and grain orientation at solid state diffusion bonded interfaces
between Cu and single crystal cubic ZrO2
Ishii H, Mun JD, Wilkinson AJ, Derby B, and Sutton AP
Materials Science
Forum (1996), vol. 207-209, 253-256
The role of texture-related mobility in the secondary recrystallization of ODS
alloys
Miodownik MA, Wilkinson AJ, and Martin JW
Materials Science Forum (1996),
vol. 204, 443-448
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1995
|
Evidence from ion channelling images for the elastic relaxation of a Si0.85Ge0.15
layer grown on a patterned Si substrate
King PJC, Breese MBH, Smulders PJM, Wilkinson AJ, Booker GR, Parker EHC, and
Grime GW
Applied Physics Letters (1995), vol. 67, 3566-3568
doi:10.1063/1.115319
The effects of surface stress-relaxation on electron channelling contrast images
of dislocations
Wilkinson AJ and Hirsch PB
Philosophical Magazine A (1995), vol. 72,
81-103
doi:10.1080/01418619508239583
Single-crystal magnetic metal-films on GaAs grown by electrodeposition
Hart R, Midgley PA, Wilkinson AJ, and Schwarzacher W
Applied Physics Letters
(1995), vol. 67, 1316-1318
doi:10.1063/1.114525
|
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1994
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1993
|
Electron channelling contrast imaging of interfacial defects in strained
silicon-germanium layers on silicon
Wilkinson AJ, Anstis GR, Czernuszka JT, Long NJ, and Hirsch PB
Philosophical
Magazine A (1993), vol. 68, 59-80
doi:10.1080/01418619308219357
The measurement of local plastic deformation in a metal-matrix composite by
electron back-scatter patterns
Wilkinson AJ, Gonzalez G, and Dingley DJ
Journal of Microscopy (1993), vol.
169, 255-261
|
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1992
|
Distribution of plastic deformation in a metal matrix composite caused by
straining transverse to the fibre direction
Wilkinson AJ and Dingley DJ
Acta Metallurgica et Materialia (1992), vol. 40,
3357-3368
doi:10.1016/0956-7151(92)90049-K
Interfacial stresses in a continuous fibre metal matrix composite
Wilkinson AJ
Scripta Metallurgica et Materialia (1992), vol. 26, 387-392
doi:10.1016/0956-716X(92)90617-N
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1991
|
Quantitative deformation studies using electron back scatter patterns
Wilkinson AJ and Dingley DJ
Acta Metallurgica et Materialia (1991), vol. 39,
3047-3055
doi:10.1016/0956-7151(91)90037-2
Deformation studies of metal matrix composites using electron backscatter
patterns
Wilkinson AJ
Materials Science and Engineering A (1991), vol. A135,
189-193
doi:10.1016/0921-5093(91)90559-6
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Conference Papers
(a rather haphazard and incomplete list at
present)
|
|
2007
|
|
|
2006
|
Strain Tensor Mapping at the Nanoscale using Electron Back Scatter
Diffraction
Wilkinson A. J., Meaden G. and Dingley D. J.
Microscopy
& Microanalysis (2006) Chicago (invited paper)
|
|
2005
|
Characterization of nitride thin films by electron backscatter diffraction and
electron channeling contrast imaging
C. Trager-Cowan, F. Sweeney, A. J.
Wilkinson, P. Trimby, A. Day, A. Gholinia, N.-H. Schmidt, P. J. Parbrook, and I. M.
Watson
Materials Research Society Symposium 2005 Boston MA
Proceedings on
‘GaN, AiN, InN and Related Materials’, eds Kuball, M; Myers, TH; Redwing, JM; and
Mukai, T, (2006), vol 892, 677-682
Electron Diffraction in the SEM:Probing lattice defects and strains
Wilkinson A. J., Meaden G. and Dingley D. J.
Proceedings of Microscopical
Society of Canada Annual Meeting (2005), McMaster University, Ontario, Canada
Strain Tensor Mapping - Extending the Limits of EBSD Analysis
Wilkinson
A. J., Meaden G. and Dingley D. J.
Microscopy & Microanalysis (2005)
Hawaii
|
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2004
|
|
|
2003
|
|
|
2002
|
Orientation dependence of the high cycle fatigue properties in a hot-cross rolled
Al-Li 8090 alloy plate
Zhai T., Wilkinson A.J., Martin J.W.
8th
International Conference on Aluminium Alloys - Aluminum Alloys 2002: Their Physical
And Mechanical Properties, (2002) 1279-1284
Fatigue : SEM based studies of crack initiation and early growth
Wilkinson A. J.
Proc. David L. Davidson Symposium TMS/ASM International Spring
Meeting (2002) Seattle, USA 17-29 (invited paper)
|
|
2001
|
Modelling The Effects Of Microstructure And Microtexture On The Statistics Of
Short Fatigue Crack Growth
Wilkinson A. J.
Proc. 10th International
Congress on Fracture, on CD Rom, Elservier Science (2001)
|
|
2000
|
Electron Backscatter Diffraction: Probing Strains At High Spatial
Resolution
Wilkinson A. J.
Proc. 6th International Conference on
Residual Stresses, Oxford, (2000), vol. 1, 625-632, IOM Communications (London)
A Multiple slip plane model for crack tip plasticity
Naronha S., Roberts
S. G., and Wilkinson A. J.
Multiscale Phenomena in Materials-Experiments and
Modeling, Materials Research Society Symposium Proceedings (2000), vol. 578,
309-314
|
|
1999
|
Examination of dislocation substructures in fatigued Cu using electron
channelling contrast imaging'
Ahmed J., Wilkinson A. J., and Roberts S.
G.
Proc. 7th International Fatigue Conference, Beijing (1999), vol. 1,
223-228
Dislocation modelling of stage I fatigue crack growth
Wilkinson A. J.,
and Roberts S. G.
Proc. 7th International Fatigue Conference, Beijing (1999),
vol. 2, 673-678
Texture intensity effect on fatigue damage in an Al-Li 8090 alloy
Zhai
T., Wilkinson A.J., Martin J.W. and Palmer I. G.
Proc. 7th International Fatigue
Conference, Beijing (1999), vol. 1, 627-632
Measurement of small misorientations using electron back scatter
diffraction
Wilkinson A. J.
Proc. Electron Microscopy and Analysis
Group Conference, Sheffield (1999) Inst. Phys. Conf. Series No. 161, 115-118
|
|
1998
|
Electron channelling contrast imaging of dislocation substructures in the
vicinity of short fatigue cracks in Cu
Ahmed J, Wilkinson A. J., Roberts
S. G., and Hirsch P. B.
Proc. 14th Int. Cong. on Electron Microscopy (1998), vol.
III, 747-748
Strain measurement using electron back scatter diffraction
Wilkinson A.
J.
Proc. 14th Int. Cong. on Electron Microscopy (1998), vol. III, 731-732
|
|
1997
|
The fabrication of Tl-Ba-Ca-Cu-O thin films on SrTiO3 and LaAlO3 buffered MgO
substrates for microwave applications
Bramley A.P., Jenkins A.P.,
Wilkinson A.J., Grovenor C.R.M. and DewHughes D.
Institute of Physics Conference
Series (1997), No. 158, 201-204
Modelling the near threshold behaviour of stage I fatigue cracks
Wilkinson A. J. and Roberts S. G.
Int. Conf. on Fundamentals of Fracture,
Gaithersburg USA, 1997
Institute of Mechanics & Materials Report No. 97-13
(1997), 69-70
SEM based electron diffraction studies of plasticity in fatigued metals
Wilkinson A. J. and Ahmed J.
Int. Conf. on Fundamentals of Fracture, Gaithersburg
USA, 1997
Institute of Mechanics & Materials Report No. 97-13 (1997),
79-80
Probing local strain fields using electron diffraction in the scanning electron
microscope
Wilkinson A. J.
Electron Microscopy and Analysis Group
Conference, Cambridge, 1997
Institute of Physics Conference Series No. 153,
221-226 (invited paper)
|
|
1996
|
Two-dimensional dopant profiling of semicoductors
Wilshaw P.R. , Sealy C. P. , Castell M. R. and Wilkinson A. J.
Scanning’96,
U. S. A. , 1996
A dislocation model for the two critical stress intensities required for threshold
fatigue crack propagation
Wilkinson A. J. and Roberts S. G.
Fundamentals of Fracture and Fatigue
Symp., Fall TMS Meeting (1996)
|
|
1995
|
SEM imaging of contrast arising from different doping concentrations in
semiconductors
Seally C. P. , Castell M. R. , Wilkinson A. J. , and
Wilshaw P. R.
9th Oxford Conf. on Microscopy of Semiconducting Materials, March
1995
Institute of Physics Conference Series No. 146 (1995), 609-612
Multiple scattering simulations of electron channelling contrast images of
dislocations at interfaces
Dudarev S. L. , Czernuszka J. T. , Peng L.-M. ,
Wilkinson A. J. , and Whelan M.J.
9th Oxford Conf. on Microscopy of
Semiconducting Materials, March 1995
Institute of Physics Conference Series
No.146 (1995), 763-766
|
|
1994
|
Effects of surface relaxation on electron channelling contrast images of misfit
dislocations
Wilkinson A. J. , Hirsch P. B., Czernuszka J. T. , and Long N. J.
Proc. 13th International Congress on Electron Microscopy, Paris (1994), vol. 1,
95-96
Relaxation modes of strained epilayers grown on patterned substrates
Wilkinson A. J.
Proc. 13th International Congress on Electron Microscopy, Paris
(1994), vol. 1, 97-98
Quantitative simulations of electron channelling patterns and backscattering from
crystals
Dudarev S. L. ,Wilkinson A. J. , Rez P., Czernuszka J. T. , and Whelan M. J.
Proc. 13th International Congress on Electron Microscopy, Paris (1994), vol. 1,
353-354
|
|
1993
|
Electron channelling contrast imaging of defects in semiconductors
Wilkinson A. J. , Hirsch P. B., Czernuszka J. T. , and Long N. J.
Invited paper at the 8th Oxford conference on the Microscopy of Semiconducting
Materials (April 1993), Institute of Physics Conference Series No. 134 (1993),
755-762
|
|
1992
|
Imaging defects in SiGe/Si heterostructures using electron channelling
contrast
Wilkinson A. J. , Anstis G. R. , Czernuszka J. T. , Long N. J. , and Hirsch P.
B.
Proc. Xth European Congress on Electron Microscopy, Granada (1992), vol. 2,
171-172
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1991
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Identification of active slip systems using electron backscatter patterns
Wilkinson A. J.
Electron Microscopy and Analysis Group Conference, Bristol
1991
Institute of Physics Conference Series No. 119 (1991), 197-200
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1990
|
Strain measurements using electron backscattering diffraction patterns
Dingley D. J. , Wilkinson A. J. , and Burns G. P.
Proc. 12th International
Congress on Electron Microscopy, San Fransico (1990), 402-403
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|
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|
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