Electron Microscopy


GEMINI 2 column FEG-SEM with Bruker e–FlashHR EBSD system

JSM 6500F

field emission gun SEM with EDAX/TSL EBSD system

Zeiss Nvision40

FEG SEM/ FIB instrument

Zeiss Auriga

FEG SEM/ FIB instrument


focused ion beam instrument


EBSD strain analysis software from BLGproductions


MTSG200 Nano-indenter

high load, and low load heads, continuous stiffness measurement, nanopositioning stage (AFM)

MTS Nano- indenter XP

high load, and low load heads, continuous stiffness measurement

MML Nanotest Platform

high temperature stage,

Mechanical Testing

1 Ultrasonic Fatigue Actuator

testing at 20kHz to gain access to very high cycle fatigue

2 Servo-Hydraulic Load Frames

horizontal frame with DMG Rubicon control system,
vertical frame with Zwigg control system, and furnace and environmental chamber

Screw Driven Mechanical Load Frames

5 frames suitable for testing at loads from ~10N to ~10kN, with various furnaces, environmental chambers etc

Digital Image Correlation

LaVision Strainmaster software for 2D strain mapping, peltier cooled 12 bit 4Mpixel camara, microzoom inspection microscope from Brunel Microscopes

Sample Preparation

'Kemet Lab'

Kemet Sponsored lab, to contain a range of Kemet/Metkon products, including: cut-off saw, slow saw, mounting press, grinding and polishing machines with auto-heads and media/lubricant despensers, ultrasonic cleaning bath, microhardness tester, and optical microscope