Electron Microscopy | |
| field emission gun SEM with EDAX/TSL EBSD system |
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| W filament SEM with EDAX/TSL EBSD system |
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| focused ion beam instrument |
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| FEG SEM/ FIB instrument |
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| EBSD strain analysis software from BLGproductions |
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Indentation | |
| MTS Nano- indenter XP |
high load, and low load heads, continuous stiffness measurement, nanopositioning stage (AFM) |
| MML Nanotest Platform |
high temperature stage, |
Mechanical Testing | |
| 2 Servo-Hydraulic Load Frames |
horizontal frame with DMG Rubicon control system, vertical frame with Zwigg control system, and furnace and environmental chamber |
| Screw Driven Mechanical Load Frames |
5 frames suitable for testing at loads from ~10N to ~10kN, with various furnaces, environmental chambers etc |
| Digital Image Correlation |
LaVision Strainmaster software for 2D strain mapping, peltier cooled 12 bit 4Mpixel camara, microzoom inspection microscope from Brunel Microscopes |
Sample Preparation | |
| 'Kemet Lab' |
Kemet Sponsored lab, to contain a range of Kemet/Metkon products, including: cut-off saw, slow saw, mounting press, grinding and polishing machines with auto-heads and media/lubricant despensers, ultrasonic cleaning bath, microhardness tester, and optical microscope |